{"created":"2023-05-15T09:42:26.017303+00:00","id":2361,"links":{},"metadata":{"_buckets":{"deposit":"08df615a-b680-49f5-9885-cd085446a7d7"},"_deposit":{"created_by":11,"id":"2361","owners":[11],"pid":{"revision_id":0,"type":"depid","value":"2361"},"status":"published"},"_oai":{"id":"oai:kagawa-u.repo.nii.ac.jp:00002361","sets":["1:132:302:313"]},"author_link":["4063","79"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2014-03","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"105","bibliographicPageStart":"99","bibliographicVolumeNumber":"11","bibliographic_titles":[{"bibliographic_title":"香川大学教育研究","bibliographic_titleLang":"ja"},{"bibliographic_title":"Journal of higher education and research, Kagawa University","bibliographic_titleLang":"en"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Background: The purpose of this paper is to determine whether the half TOEIC test can be an effective and useful tool in preparing students for the real or actual full test. In addition, the question as to whether the test can be used as a reliable indicator of future scores in the full test will be discussed along with possible reasons why it does or does not reflect the full test scores. We will begin with a brief history of the TOEIC test and how it is used in Kagawa University followed by an analysis of the data and finally our resulting conclusions.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10002_heading_23":{"attribute_name":"見出し","attribute_value_mlt":[{"subitem_heading_banner_headline":"調査研究","subitem_heading_language":"ja"},{"subitem_heading_banner_headline":"Practical Reports","subitem_heading_language":"en"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"香川大学大学教育開発センター","subitem_publisher_language":"ja"}]},"item_10002_relation_12":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"120007014020","subitem_relation_type_select":"NAID"}}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA1197154X","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-0001","subitem_source_identifier_type":"PISSN"}]},"item_10002_text_25":{"attribute_name":"WAID","attribute_value_mlt":[{"subitem_text_value":"79"}]},"item_10002_text_26":{"attribute_name":"KEID","attribute_value_mlt":[{"subitem_text_value":"27972"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"MacAnthony, Diarmuid Joseph","creatorNameLang":"ja"},{"creatorName":"マカントニー, ダモット ジョセフ ","creatorNameLang":"ja-Kana"},{"creatorName":"MacAnthony, Diarmuid Joseph","creatorNameLang":"en"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"McCrohan, Gerardine Mary","creatorNameLang":"ja"},{"creatorName":"マクラハン, ジェラディーン メーリー","creatorNameLang":"ja-Kana"},{"creatorName":"McCrohan, Gerardine Mary","creatorNameLang":"en"}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-12-11"}],"displaytype":"detail","filename":"AA1197154X_11_99_105.pdf","filesize":[{"value":"1.3 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"AA1197154X_11_99_105.pdf","objectType":"fulltext","url":"https://kagawa-u.repo.nii.ac.jp/record/2361/files/AA1197154X_11_99_105.pdf"},"version_id":"f89e7dae-4ff9-4423-9786-6f28d4a2f0fa"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"学生がTOEIC模擬テストを受ける利点について","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"学生がTOEIC模擬テストを受ける利点について","subitem_title_language":"ja"},{"subitem_title":"The Benefits of Doing the Practice Half-test for Students Taking the Full TOEIC","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"11","path":["313"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2017-12-21"},"publish_date":"2017-12-21","publish_status":"0","recid":"2361","relation_version_is_last":true,"title":["学生がTOEIC模擬テストを受ける利点について"],"weko_creator_id":"11","weko_shared_id":-1},"updated":"2023-08-31T07:44:24.560849+00:00"}